Equipment
FE-SEM/EBSD (shared with other labs.)JEOL JSM-7001FA / TSL OIM- Microstructure observation |
Digital MicroscopeKeyence VHX-900- Surface observation | |||||
Optical MicroscopeOlympus BX60M,DP20- Microstructure observation |
Scanning Probe Microscope, SPMShimazu SPM-9600 / Hysitron TriboScope- Surface observation | |||||
X-ray Diffractometer with Two-dimensional DetectorBrukerAXS D8 DISCOVER with GADDS- Residual stress measurement |
X-ray Stress AnalyzerRigaku AutoMATE- Residual stress measurment | |||||
X-ray Stress Analyzerリガク MSF-3M- Residual stress measurment |
Instrumented Indentation TesterFrontics Micro-AIS- Residual stress measurment | |||||
Precision Universal TesterShimazu AG-250kNX,AG-250kNG- Materials testing and inspection |
Instrumented Indentation TesterFRONTICS AIS-2100- Materials testing and inspection | |||||
Micro Hardness TesterShimazu HMV-FA1- Hardness testing |
Creep Testing MachineYONEKURA Mfg.- Creep testing | |||||
Muffle FurnaceYONEKURA Mfg.- Heat treatment |
Workstation and Simulation SoftwareAbaqus, SYSWELD, Marc, etc.- Numerical simulation | |||||